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Title of the paper: Weak and Strong SRAM cells analysis in embedded memories for PUF applications Available at: https://ieeexplore.ieee.org/abstract/document/8959939 |
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SRAM PUF proposals try to reduce the impact of weak cells by minimizing their presence in the response or masking them out an identification methodology.
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Considering differences between parameters, the weak cells range when MF considers Vth includes 29.7% of the total cells while, the weak cells range when MF considers ID includes 40.95% of the total cells. The reason
for this difference will be explored in future work.
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