Page Comparison

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1. ECC

   1. Polar codes: A Robust SRAM-PUF Key Generation Scheme Based on Polar Codes

   2. based on Hashing and BCH: Lightweight (Reverse) Fuzzy Extractor with Multiple Referenced PUF Responses

   3. BCH: https://www.google.com/url?sa=t&rct=j&q=&esrc=s&source=web&cd=&cad=rja&uact=8&ved=2ahUKEwiwse6n79H_AhVMTqQEHUzXD_YQFnoECBEQAQ&url=https%3A%2F%2Frepository.tudelft.nl%2Fislandora%2Fobject%2Fuuid%253A4f879ecf-95d5-4482-8931-8c40abde0e79&usg=AOvVaw0n3HcX2dWx6for1QIi5yX8&opi=89978449

   4. Repetition code: A Microcontroller SRAM-PUF

   5. HC (Hamming Code) / Golay2412 (corrects up to 3 errors for each 12 bits) / Repetition Code: https://arxiv.org/abs/2301.07048

2. Pre-selection

   1. alheyasat19weak

   2. Error reduction of SRAM-based physically unclonable function for chip authentication

   3. https://www.sciencedirect.com/science/article/pii/S0167926018304747 A reliable PUF in a dual function SRAM

   4. Systematic Correlation and Cell Neighborhood Analysis of SRAM PUF for Robust and Unique Key Generation

   5. one VDD/temperature measure: A Method to Improve Reliability in a 65-nm SRAM PUF Array

   6. Fourier analysis: A Novel Security Key Generation Method for SRAM PUF Based on Fourier Analysis

   7. according to MF and SD: https://www.mdpi.com/2079-9292/10/12/1479

3. Both: ECC+preselection

   1. A Proof of Concept SRAM-based Physically Unclonable Function (PUF) Key Generation Mechanism for IoT Devices

4. Modified SRAM design (hardening)

   1. Analysis and reduction of SRAM PUF Bit Error Rate

   2. https://www.mdpi.com/2079-9268/7/1/2

   3. hardening +ECC: https://www.sciencedirect.com/science/article/pii/S0026269220304432 → Typical constructions comprise a repetition code (C rep) followed by a Reed-Muller code (RM) to obtain a failure rate P_fail <10⁻⁶.

   4. hardening +ECC: A 0.19pJ/b PVT-Variation-Tolerant Hybrid Physically Unclonable Function Circuit for 100% Stable Secure Key Generation in 22nm CMOS

   5. new SRAM design + ECC: An SRAM-Based PUF With a Capacitive Digital Preselection for a 1E-9 Key Error Probability

5. Improving reliability through power-up control

   1. Power-up control techniques for reliable SRAM PUF

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